Konjhodzic Dr., Denan

Application Engineer, Instrument Systems

Konjhodzic Dr., Denan

Application Engineer, Instrument Systems


Dr. Denan Konjhodzic is Application Engineer at Instrument Systems and is working on the following topics: LED and SSL (solid state lighting) metrology, Calibrations in photometry, Display measurement technology, Participation in the standardization bodies of the CIE and DIN.

  • Born in 1976 in Mostar, Bosnia and Herzegovina
  • 1997-2003 physics studies in Duisburg, Germany
  • 2003-2007 PhD thesis in the department “Optical Materials and Nanostructures” at the Max Planck Institute in Mülheim an der Ruhr, Germany
  • 2007 doctoral examination at the Free University Berlin
  • Since 2008 applications engineer at Instrument Systems GmbH, Munich

Solid State Lighting Measurements – From Basics to Recent Developments

The lecture covers the basics of test and measurements of solid-state lighting (SSL) products and is suitable for beginners as well as experts in the field. To provide the same level of knowledge for all participants, an introduction to SSL metrology and the relevant standards such as the new standard CIE S025 are given in the beginning. Basic quantities and principles in photometry and colorimetry will be defined and proper equipment for their determination will be presented. Participants will learn how to evaluate the optical performance of the basic components of SSL sources.

After that, the most essential measurement procedures and the used instrumentation in SSL measurement will be introduced with focus on goniophotometers and integrating spheres. To provide further application insight to SSL measurement a comparative study of the previously introduced methods will be presented. Since CIE S025 is the first international standard on requirements to perform photometric and colorimetric measurements on LED devices the content and consequences of CIE S025 will be reviewed in most important details. Particularly, an implementation of the auxiliary photometer method for goniophotometric measurements recommended by CIE S025 will be briefly presented.

Afterwards, in a more practical part organized by TÜV, additional aspects for market entry according to European regulations will be shown and discussed. A focus will also be the relevant data with respect to authorities as well as news in the regulation area, e.g. regulation (EU) 1428/2015. Therefore, measurements will also be performed with regard to get all relevant information for a test report. Also some errors and challenges for practical measurements will be shown, e.g. the issues with modern LED modules and dimming, such as PWM. Some other issues, which has to be in mind when measuring low voltage devices, will also be shown in the practical part.

All session by Konjhodzic Dr., Denan

Session 6 – DAY 3 | SEPT 28

08:00 - 10:00
Conference Rooms
LpS & TiL 2018 Flyer